TT.I.A
11:00 - 12:30
| Microscopy methods for Material Science | ||
| SYNOPSIS |
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| TT.I.A.1 WS.I.B.1 |
Giulio LAMEDICA Carl Zeiss Italia, Germany Welcome and Introduction |
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| TT.I.A.2 WS.I.B.2 |
Lars-Oliver KAUTSCHOR Carl Zeiss Microscopy GmbH X-Ray Microscopy - 3D and 4D Imaging for Materials Science |
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| TT.I.A.3 WS.I.B.3 |
Andrea CAVALLO CERTEMA, Grosseto Nanostructuration of fault rocks during an earthquake: a micro - analytical FESEM based platform to disclose chemical composition and structural attributes |
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| TT.I.A.4 WS.I.B.4 |
Alessandro DI NICOLA CV Carl Zeiss Italia Optical Microscopy for Geoscience abst |
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| Chair: Marco CANTONI, EPFL, Lausanne, Switzerland In collaboration with: ZEISS |
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SYNOPSIS
The variety of processing methods, structural characteristics, and property metrics create a nearly infinite design space for materials scientists and engineers to play in. Making sense of the connections between these factors requires the central coordination of a slew of characterization methods. The large spectrum of microscopy techniques reflects the diversity of complex and multi-scale materials science problems that exist everywhere, and touch on many components of the materials design paradigm. It’s with this particular link in the chain that ZEISS contributes to the scientific progress and future. |
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