Ultimate TEM characterization and imaging

The impressive improvement in the performances of Transmission Electron Microscopy in recent years has pushed this investigation method to obtain information at the atomic level both in hard and in soft matter respectively. By coupling aberration correctors, high performance electron guns, last generation image capturing devices supported by an extremely powerful data acquisition and analysis the investigation of matter structure at the atomic level has reached a qualitative level very hard to suppose not a too long time ago. Consequently, the available information has been pushed forward and in this section the state of the art will be analysed as far as the frozen soft matter and the more resistant hard matter are concerned.