Advances in Microscopy-based Nanocharacterization Methodologies

Nanotechnology is an emerging interdisciplinary area that is expected to have wide impact in all fields of science and technology. Observing and understanding the novel and improved physical, chemical and biological properties, phenomena, and functionalities that nano-sized materials exhibits, is a fundamental tool to fully exploit the potentialities of nanotechnology. This session focuses on the advances in microscopy-based nanocharacterization methodologies, ranging from STEM-in-SEM electron tomography, scanning ion microscopies, correlative microscopy and combined scanning probe and transmission electron microscopies.