Innovation in Scanning Electron Microscopy

Scanning Electron Microscopy is one of the most versatile and powerful characterization techniques in the field of nanotechnologies and material sciences. In the lat years several instrumentation novelties have been released, making these class of instruments not only a characterization tool, but also a complete platform for nano materials manipulation, devices design and fabrication. This session is organized in close collaboration with the main instrumentation manufacturers and aims at shown the main innovations in the field.