TT.VI.B

16:00 - 17:30

Advance in Near Field Probe Microwave and mm-wave Microscopy for Surface and Subsurface Characterization of Materials
In collaboration with: CNR IMM - Ministry of Foreign Affairs and International Cooperation - National Institute of Standards and Technology (NIST)
SYNOPSIS
TT.VI.B.1 WS.III.4.1	Samuel BERWEGER CV National Institute of Standards and Technology - NIST, Boulder, USA Nanoelectronic Characterization using Microwave Near-Field Microscopy
TT.VI.B.2 WS.III.4.2	Marco FARINA CV Marche Polytechnic University Application of Scanning Microwave Microscopy to Biological Samples
TT.VI.B.3 WS.III.4.3	Giovanni Maria SARDI CV CNR IMM, Roma Near-field Microwave Microscopy for Surface and Subsurface Characterization of Materials
TT.VI.B.4 WS.III.4.4	Venkatachalam SUBRAMANIAN CV Indian Institute of Technology Madras, Chennai, India Feedback control for constant height mode operation in scanning near-field microwave microscopy
Chair: Emanuela PROIETTI, CNR IMM, Roma
The symposium is part of the workshop WS.III on "Advanced Scanning Probe Microscopies"

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