Advanced Characterization Techniques for N&N

WS.I Advanced Characterization Techniques for Nanotechnologies and Nanosciences Workshop in memory of Pier Giorgio Merli September 12 -14
WORKSHOP COMMITTEE Onofrio Antonino CACIOPPO, LFoundry Vittorio MORANDI, CNR IMM Marco ROSSI, Sapienza University of Rome Beatrice VALLONE, Sapienza University of Rome Marco VITTORI ANTISARI, NanoItaly Association

*organized by*
in collaboration with: ASSING, FEI, JEOL, TESCAN, ZEISS
Ten years ago, our friend, mentor and colleague, Pier Giorgio Merli passed away. He was a physicist, a Research Director of the CNR-IMM Institute, and a passionate scientist and electron microscopist. Giorgio graduated at the Bologna University in 1967, he has devoted for 40 years all his energies to research, innovation and formation in the field of electron microscopy, gaining both national and international reputation. He was President of the Italian Society for Electron Microscopy from 1984 to 1987 and Director of the IMM (formerly LAMEL) Institute from 1992 to 1998. He published over 100 articles in international scientific journals and edited or co-edited the proceedings of several national and international schools on electron microscopy. In 1974 Giorgio, together with two other physicists of the University of Bologna, GianFranco Missiroli and Giulio Pozzi, realized “The double-slit experiment with single electrons”, which was chosen in 2002 as the most beautiful experiment in Physics by the magazine Physics World (http://l-esperimento-piu-bello-della-fisica.bo.imm.cnr.it/english/index.html). Above all, this was the result of his passion for the investigation of the fundamental physical phenomena that always drove his scientific activity. He also had well clear the relevance of the transformation of an idea into an invention, which is testified by the various patents on electron guns or electron detectors that he obtained. He was a scientist and, on top of that, a rigorous and passionate intellectual, one never completely satisfied of the acquired knowledge, aiming always at a deeper and more refined level of understanding. He was aware of his role as an intellectual, he was honest and disinterested, always trusting in coherence, and his professional as well as human relationships were inspired by the values of morality, equity and merit. The workshop "Advanced Characterization Techniques for Nanotechnologies and Nanosciences" is dedicated to Giorgio's memory, to continue his legacy in studying, developing and understanding microscopic methodologies as fundamental tools for the physical, chemical and life sciences, as well as to promote his professional, cultural and human values, in particular among the younger scientists to whom Giorgio has been dedicating most of his energies and whom he has always trusted and encouraged with all his great enthusiasm.
12 September
09:00 - 10:30 Keynote Session: "Ultimate TEM characterization and imaging" WS.I.1 - HT.I.A

*SYNOPSIS*
WS.I.1 HT.I.A.1	Beatrice VALLONE CV Sapienza University of Rome Single Particle Cryo-EM structure of the complex between human Ferritin and Transferrin Receptor: a gateway for targeted delivery and theranostics
WS.I.2 HT.I.A.2	Elvio CARLINO CV CNR-IMM, Lecce Atomic Resolution Transmission Electron Microscopy: On the way toward the ultimate spatial resolution and accuracy
Chair: Vittorio MORANDI, CNR - IMM, Bologna
10:30 - 11:00 Coffee Break
11:00 - 12:30 X-Ray Microscopy WS.I.2 - TT.I.A

SYNOPSIS
WS.I.2.1 TT.I.A.1	Lars-Oliver KAUTSCHOR Carl Zeiss Microscopy Extending Synchrotron X-ray Microscopy to the Laboratory” (to be confirmed)
WS.I.2.2 TT.I.A.2	Alessia CEDOLA CNR Nanotec X-Ray Phase Contrast Tomography for Regenerative medicine
WS.I.2.3 TT.I.A.3	Tevfik Onur MENTES CV Elettra-Sincrotrone Trieste X-ray photoemission electron microscopy studies in ultrathin film magnetism
WS.I.2.4 TT.I.A.4	Manuel DIERICK Tescan Orsay Holding Exploring Materials Evolution with Laboratory-based Dynamic X-ray Tomography
Chair: Narciso GAMBACORTI, Cea-Leti & PAC-G, Grenoble, France
12:30 - 14:00 Light Lunch
14:00 - 15:30 Advances in Microscopy-based Nanocharacterization Methodologies WS.I.3 - TT.II.A
In collaboration with: ZEISS
SYNOPSIS
WS.I.3.1 TT.II.A.1	Matteo FERRONI CV University of Brescia The implementation of the STEM imaging mode in the SEM for electron tomography
WS.I.3.2 TT.II.A.2	Giulio LAMEDICA Carl Zeiss Italia Latest Advances in Electron and Ion Microscopy
WS.I.3.3 TT.II.A.3	Joerg LINDENAU CV Carl Zeiss Microscopy Large Volume and Correlative Scanning Electron Microscopy
WS.I.3.4 TT.II.A.4	Umberto CELANO CV IMEC, Belgium Site-specific analysis for nanoelectronics using hybrid SPM-TEM metrology
Chair: Elvio CARLINO, CNR-IMM, Lecce (to be confirmed)
15:30 - 16:00 Coffee Break
16:00 - 17:30 Cryo Electron Microscopy: the resolution revolution WS.I.4 - TT.III.A
In collaboration with: ZEISS, THERMO FISHER SCIENTIFIC & JEOL
*SYNOPSIS*
WS.I.4.1 TT.III.A.1	Giuseppe ZANOTTI CV University of Padova Cryo -EM : a crystallographer view
WS.I.4.2 TT.III.A.2	Ludovic RENAULT CV Leiden University, Leiden, The Netherlands Running an International service facility for cryoEM
WS.I.4.3 TT.III.A.3	Massimiliano MALETTA CV Thermo Fisher Scientific The role of Cryo-electron microscopy in structural biology after the "resolution revolution"
WS.I.4.4 TT.III.A.4	Guillaume BRUNETTI CV JEOL EUROPE New JEOL TEM developments for cryo biology
WS.I.4.5 TT.III.A.5	Joerg LINDENAU CV Carl Zeiss Microscopy Workflow for Correlative Cryo-Imaging
Chair: Beatrice VALLONE, Sapienza University of Rome
13 September
09:00 - 10:30 Keynote Session "Scanning Ion Microscopy: Nanocharacterization and Nanofabrication" WS.I.5 - HT.II.A
In collaboration with: ASSING/Tescan
*SYNOPSIS*
WS.I.5.1 HT.II.A.1	Petr KLIMEK CV Tescan Orsay Holding & Brno University of Technology Preparation of Aluminum Specimen with Gallium and Xenon Plasma Focused Ion Beam for Further Nano-characterization
WS.I.5.2 HT.II.A.2	Gian Carlo GAZZADI CV CNR –Nano, Modena Focused Ion Beam (FIB) and Focused Electron Beam Induced Deposition (FEBID) for advanced nanocharacterization and nanofabrication
Chair: Marco VITTORI ANTISARI, Asssociazione Nanoitaly
10:30 - 11:00 Coffee Break
11:00 - 12:30 Advance in FIB/SEM Technology and its Contribution to Scientific Problem Solving WS.I.6 - TT.IV.A
In collaboration with: TESCAN & ASSING
*SYNOPSIS*
WS.I.6.1 TT.IV.A.1	Petr KLIMEK CV Tescan Orsay Holding & Brno University of Technology Advanced FIB/SEM techniques and applications
WS.I.6.2 TT.IV.A.2	Enrico SALVATI CV Department of Engineering Science, University of Oxford, UK Nanostructural aspects of human dental enamel and their evolution due to dental caries
WS.I.6.3 TT.IV.A.3	Alessandro LAVACCHI CV CNR ICCOM, Firenze 2D materials imaging and nanofabrication in the FIB/SEM
WS.I.6.4 TT.IV.A.4	Audrey GARNIER STMicroelectronics Plasma FIB: enlarge your field of view and your field of applications
Chair: Daniele DE FELICIS, University of Roma Tre
12:30 - 14:00 Light Lunch
14:00 - 15:30 Innovation in Scanning Electron Microscopy WS.I.7 - TT.V.A
In collaboration with: ZEISS, THERMO FISHER SCIENTIFIC & JEOL
SYNOPSIS
WS.I.7.1 TT.V.A.1	Joerg LINDENAU CV Carl Zeiss Microscopy Large Volume and Correlative Scanning Electron Microscopy
WS.I.7.2 TT.V.A.2	Guillaume BRUNETTI CV JEOL EUROPE JSM-IT200: A versatile tungsten SEM
WS.I.7.3 TT.V.A.3	Federico MECARINI CV ASSING Triglav Lens: collection system and imaging modes
WS.I.7.4 TT.V.A.4	Paolo DE NATALE CV Hitachi High-Technologies Europe GmbH Hitachi new signals detection technique in cold and Schottky Field Emission SEM
Chair: Luca ORTOLANI, CNR IMM, Bologna (to be confirmed)
15:30 - 16:00 Coffee Break
16:00 - 17:30 Innovation in Transmission Electron Microscopy WS.I.8 - TT.VI.A

SYNOPSIS
WS.I.8.1 TT.VI.A.1	Federico VENTURI CV CNR NANO & University of Modena and Reggio Emilia Improving the transmission electron microscope capabilities through holography and phase manipulation
WS.I.8.2 TT.VI.A.2	Mauro GEMMI CV IIT, Pisa 3D electron diffraction on hard and soft matter
WS.I.8.3 TT.VI.A.3	Angelica CHIODONI CV Polytechnic of Turin & IIT Tin and copper - based catalysts for CO2 reduction
WS.I.8.4 TT.VI.A.4	Regina CIANCIO CV CNR IOM, Trieste Multifunctional nanoreactors for combined in-operando STEM and synchrotron spectroscopy
Chair: Andrea PARISINI, CNR-IMM, Bologna (to be confirmed)
14 September
09:00 - 10:30 Keynote Session: "Spectroscopic characterization and imaging" WS.I.9 - HT.III.A

*SYNOPSIS*
WS.I.9.1 HT.III.A.1	Lars-Oliver KAUTSCHOR Carl Zeiss Microscopy GmbH HIM with SIMS - High resolution Imaging and Nano-analytics with He and Ne ions
WS.I.9.2 HT.III.A.2	Giovanni BERTONI CV CNR IMEM, Trento Chemical and spectroscopic characterization from nm to sub-nm scale with EFTEM and STEM-EELS
Chair: Regina CIANCIO, CNR-IOM, Trieste
10:30 - 11:00 Coffee Break
11:00 - 12:30 Microscopy techniques for industrial needs 1 WS.I.10 - TT.VII.A
In collaboration with: LFoundry
SYNOPSIS
WS.I.10.1 TT.VII.A.1	Simona BONINELLI CV CNR IMM, Catania Defects, activation and morphological modification by out of equilibrium processes in Si and Ge-based materials
WS.I.10.2 TT.VII.A.2	Domenico MELLO CV STMicroelectronics New Approach in TEM-EDS Quantitative Analysis, Used for Auger Calibration in Order to Set an Advanced Back Metal Control
WS.I.10.3 TT.VII.A.3	Andrea PARISINI CV CNR IMM, Bologna Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis methods for Application to Silicon Oxycarbides Thin Films
WS.I.10.4 TT.VII.A.4	Massimo VIGHI CV ENI Versalis, Mantova Repetita iuvant… Polymer Microscopy
WS.I.10.5 TT.VII.A.5	Francesco ROSSELLA CV Scuola Normale Superiore/NEST, Pisa Electroluminescence and crystal phases in hybrid metal-GaAs nanowire devices
Chair: Onofrio Antonino CACIOPPO, LFoundry
12:30 - 14:00 Light Lunch
14:00 - 15:30 Innovation in Optical Microscopy WS.I.11 - TT.VIII.A

*SYNOPSIS*
WS.I.11.1 TT.VIII.A.1	Marco LEONETTI IIT, CLNS@SAPIENZA Roma Scattering Assisted Localization Fluorescence Imaging
WS.I.11.2 TT.VIII.A.2	Francesca CELLA ZANACCHI IIT Genova Quantitative super-resolution microscopy using dna origami
WS.I.11.3 TT.VIII.A.3	Francesca INTONTI University of Florence & European Laboratory for Non-Linear spectroscopy - LENS Deep Sub-wavelength imaging of localized photonic modes
WS.I.11.4 TT.VIII.A.4	Hilton BARBOSA DE AGUIAR CV Ecole Normale Supérieure de Paris, France Compressive Raman microspectroscopy
Chair: Marco LEONETTI, IIT@SAPIENZA
15:30 - 16:00 Coffee Break
16:00 - 17:30 Microscopy techniques for industrial needs 2 WS.I.12 - TT.IX.A
In collaboration with: Leonardo
*SYNOPSIS*
WS.I.12.1 TT.IX.A.1	Massimo VANZI CV University of Cagliari Combined techniques for advanced failure analysis of Photonic Devices
WS.I.12.2 TT.IX.A.2	Luca ORTOLANI CV CNR IMM, Bologna Transmission Electron Interferometric Methods for Materials Characterization
WS.I.12.3 TT.IX.A.3	Paolo MENGUCCI CV Marche Polytechnic University Advanced material characterization for additive manufacturing
WS.I.12.4 TT.IX.A.4	Tiziana DEL BUONO CV Lfoundry Optimization of FIB lamellas preparation for gate-oxide pinholes characterization
Chair: Onofrio Antonino CACIOPPO, LFoundry

Advanced Characterization Techniques for Nanotechnologies and Nanosciences	AgriNanoTechniques	Advanced Scanning Probe Microscopies	Microfluidics and Biosystems for personalized medicine	Nanotechnologies for innovative medicine
*September 12-14*	*September 12*	*September 13*	*September 14*	*September 13*

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