Removing interferences with the MS-MS technology in triple quadrupole ICP-MS to improve the analytical detection of inorganic nanomaterials

Paolo SCARDINA, Agilent Technologies

ICP-MS is the most powerful technique for the determination of trace elements and, operated in single particle mode or hyphenated to fractionation techniques (e.g. Field Flow Fractionation), is widely used for detecting inorganic nanoparticles.

Agilent has developed a second generation of QQQ-ICP-MS systems able to increase the power of interferences removal and decrease the background for elements, such as silicon (Si), titanium (Ti) and iron (Fe), which are used as analytical masses in the determination of nanomaterials of importance in the agri-food sector.

The presentation focuses on the reaction strategy used in ICP-MS/MS to remove the above-mentioned polyatomic interferences.

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