TS.IV.B
17:15 - 18:45
| Advances in mechanical and strain analysis at the nanoscale | ||
| go to synopsis | ||
| TS.IV.B.1 | Edoardo BEMPORAD, Dept. of Engineering, University "Roma Tre" Focused ion beam methods for micro-scale residual stress assessment in thin films |
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| TS.IV.B.2 | Athanassios GALANIS, NanoMegas Nanomaterials Orientation and Strain Analysis at 1 nm scale using Precession Electron Diffraction techniques in TEM |
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| TS.IV.B.3 | Antonio RINALDI, ENEA SEM-monitored nanoindentation helps understanding blistering in Cu2ZnSnS4 (CZTS) thin films casued by residual stresses |
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| TS.IV.B.4 | Marco Di Donato, Anton Paar, Switzerland Optimized Design of Surface Mechanical Testing Procedures |
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| TS.IV.B.5 | Ennio CAPRIA, Nanoelec Advanced Characterisation Platform - Grenoble European Synchrotron (ESRF) Structural characetrization of nano-electronic devices based on neutrons and synchrotron X-rays |
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