TT.V.A
14:00 - 15:30
Innovation in Scanning Electron Microscopy | ||
In collaboration with: ZEISS & JEOL |
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SYNOPSIS |
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TT.V.A.1 WS.I.7.1 |
Joerg LINDENAU CV |
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TT.V.A.2 WS.I.7.2 |
Guillaume BRUNETTI CV |
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TT.V.A.3 |
Federico MECARINI CV |
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TT.V.A.4 |
Paolo DE NATALE CV |
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Chair: Luca ORTOLANI, CNR IMM, Bologna (to be confirmed) |
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The symposium is part of the workshop WS.I on "Advanced Characterization Techniques for Nanotechnologies and Nanosciences" |